TPCF8304 2006-11-17 1 toshiba field effect transistor silicon p-chann el mos type (u-mos iv) TPCF8304 notebook pc applications portable equipment applications ? low drain-source on resistance: r ds (on) = 60 m ? (typ.) ? high forward transfer admittance: |y fs | = 5.9 s (typ.) ? low leakage current: i dss = ? 10 a (max) (v ds = ? 30 v) ? enhancement model: v th = ? 0.8 to ? 2.0 v, (v ds = ? 10 v, i d = ? 1 ma) absolute maximum ratings (ta = 25c) characteristic symbol rating unit drain-source voltage v dss -30 v drain-gate voltage (r gs = 20 k ) v dgr -30 v gate-source voltage v gss 20 v dc (note 1) i d -3.2 drain current pulse (note 1) i dp -12.8 a single-device operation (note 3a) p d (1) 1.35 drain power dissipation (t = 5 s) (note 2a) single-device value at dual operation (note 3b) p d (2) 1.12 single-device operation (note 3a) p d (1) 0.53 drain power dissipation (t = 5 s) (note 2b) single-device value at dual operation (note 3b) p d (2) 0.33 w single-pulse avalanche energy (note 4) e as 0.67 mj avalanche current i ar -1.6 a repetitive avalanche energy single-device value at dual operation (note 2a, 3b, 5) e ar 0.11 mj channel temperature t ch 150 c storage temperature range t stg -55~150 c note: for notes 1 to 6, see the next page. using continuously under heavy loads (e .g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. please design the appropriate reliability upon reviewing the toshiba semiconductor reliabilit y handbook (?handling precautions?/derating concept and methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). caution: this transistor is an electros tatic-sensitive device. handle with care. unit: mm jedec D jeita D toshiba 2-3u1b weight: 0.011 g (typ.) circuit configuration 1 2 3 4 8 7 6 5
TPCF8304 2006-11-17 2 thermal characteristics characteristic symbol max unit single-device operation (note 3a) r th (ch-a) (1) 92.6 thermal resistance, channel to ambient (t = 5 s) (note 2a) single-device value at dual operation (note 3b) r th (ch-a) (2) 111.6 c/w single-device operation (note 3a) r th (ch-a) (1) 235.8 thermal resistance, channel to ambient (t = 5 s) (note 2b) single-device value at dual operation (note 3b) r th (ch-a) (2) 378.8 c/w marking (note 6) note 1: ensure that the channel temperature does not exceed 150 . note 2: (a) device mounted on a glass-epoxy board (a) (b) device mounted on a glass-epoxy board (b) note 3: a) the power dissipation and thermal resistance values shown are for a single device. (during single-device operation, power is applied to one device only.) b) the power dissipation and thermal resistance values shown are for a single device. (during dual operation, power is evenly applied to both devices.) note 4: v dd = -24 v, t ch = 25c (initial), l = 0.2 mh, r g = 25 , i ar = -1.6 a note 5: repetitive rating; pulse widt h limited by max channel temperature note 6: to the lower left of the part no. marking indicates pin 1. fr-4 25.4 25.4 0.8 (unit: mm) (b) fr-4 25.4 25.4 0.8 (unit: mm) (a) 25.4 25.4 part no. (or abbreviation code) f5d a line indicates lead (pb)-free package or lead (pb)-free finish. lot code (month) lot no. pin #1 lot code (year) product-specific code
TPCF8304 2006-11-17 3 electrical characteristics (ta = 25c) characteristic symbol test condition min typ. max unit gate leakage current i gss v gs = 16 v, v ds = 0 v D D 10 a drain cut-off current i dss v ds = -30 v, v gs = 0 v D D -10 a v (br) dss i d = -10 ma, v gs = 0 v -30 D D drain-source breakdown voltage v (br) dsx i d = -10 ma, v gs = 20 v -15 D D v gate threshold voltage v th v ds = -10 v, i d = -1 ma -0.5 D -1.2 v r ds (on) v gs = -4.5 v, i d = -1.6 a D 80 105 drain-source on resistance r ds (on) v gs = -10 v, i d = -1.6 a D 60 72 m forward transfer admittance |y fs | v ds = -10 v, i d = -1.6 a 2.9 5.9 D s input capacitance c iss D 600 D reverse transfer capacitance c rss D 60 D output capacitance c oss v ds = -10 v, v gs = 0 v, f = 1 mhz D 70 D pf rise time t r D 5.3 D turn-on time t on D 12 D fall time t f D 8.4 D switching time turn-off time t off duty < = 1%, t w = 10 s D 34 D ns total gate charge (gate-source plus gate-drain) q g D 14 D gate-source charge 1 q gs1 D 1.4 D gate-drain (?miller?) charge q gd v dd ? -24 v, v gs = -10 v, i d = -3.2 a D 2.7 D nc source-drain ratings and characteristics (ta = 25c) characteristic symbol test condition min typ. max unit drain reverse current pulse (note 1) i drp D D D -12.8 a forward voltage (diode) v dsf i dr = -3.2 a, v gs = 0 v D D 1.2 v r l = 9.38 v dd ? -15 v -10 v v gs 0 v 4.7 i d = -1.6 a v out
TPCF8304 2006-11-17 4 drain current i d (a) r ds (on) ? i d drain-source on resistance r ds (on) (m ) gate-source voltage v gs (v) i d ? v gs drain current i d (a) drain-source voltage v ds (v) gate-source voltage v gs (v) v ds ? v gs drain-source voltage v ds (v) i d ? v ds drain current i d (a) drain-source voltage v ds (v) i d ? v ds drain current i d (a) drain current i d (a) ? y fs ? ? i d forward transfer admittance ? y fs ? (s) 10 0.1 -1 -10 100 1000 -5 -4 -2 -1 0 -3 common source ta = 25c pulse test v gs = -2.3 -2.5 -2.6 -3.0 -2.8 -3.5 -2.7 -10 -6 -4.5 0 -0.2 -0.4 -0.6 -0.8 -1.0 v gs = -2.3 v common source ta = 25c pulse test -2.6 -3.5 -3.0 -10 -2.5 -6 -2.7 -2.8 -4.5 -10 -8 -4 -2 0 -6 0 -1 -2 -3 -4 -5 ta = ? 55c 25 100 common source v ds = -10 v pulse test 0 -1 -2 -3 0 -5 -4 -8 -6 -4 -2 i d = -3.2a common source ta = 25 pulse test -1.6 -0.8 0 -2 -4 -6 -8 -10 0 -1.6 -1.2 -0.8 -0.4 -2.0 25 100 ta = ? 55c common source v ds = -10 v pulse test -0.1 -0.3 -1 -3 -10 1 10 100 v gs = -4.5 v -1 0 common source ta = 25c pulse test
TPCF8304 2006-11-17 5 drain-source voltage v ds (v) capacitance ? v ds capacitance c (pf) -0.1 10 100 1000 -1 -3 -5 -10 -30 -50 -100 common source v gs = 0 v f = 1 mhz ta = 25c c iss c oss c rss ambient temperature ta (c) r ds (on) ? ta drain-source on resistance r ds (on) (m ) drain-source voltage v ds (v) i dr ? v ds drain reverse current i dr (a) gate threshold voltage v th (v) ambient temperature ta (c) v th ? ta 0 -0.5 -1.0 -1.5 -2.0 ? 80 ? 40 0 40 80 120 160 common source v ds = -10 v i d = -1ma pulse test drain power dissipation p d (w) ambient temperature ta (c) p d ? ta 0 0.1 common source ta = 25c pulse test 0.3 0.3 0.5 1 3 5 10 0.9 1.2 v gs = 0 v -5.0 -3.0 -1.0 -10 0.6 1.5 2.0 0.8 0 0 40 80 120 160 0.4 1.2 1.6 200 device mounted on a glass-epoxy board (a) (note 2a) (1) single-device operation (note 3a) (2) single-device value at dual operation (note 3b) device mounted on a glass-epoxy board (b) (note 2b) (3) single-device operation (note 3a) (4) single-device value at dual operation (note 3b) 5s (1) (2) (3) (4) gate-source voltage v gs (v) total gate charge q g (nc) dynamic input/output characteristics drain-source voltage v ds (v) 0 4 8 common source i d = -3.2 a ta = 25c pulse test v dd = -24v v ds v gs 12 16 -25 -10 0 -15 -20 -15 -10 0 -12 -6 -24 -12 v dd = -6v -5 -5 -30 160 ? 40 0 40 80 120 ? 80 150 120 60 30 0 90 v gs = -10v v gs = -4.5v i d = -0.8a, -1.6a, -3.2a i d = -0.8a, -1.6a, -3.2a common source pulse test
TPCF8304 2006-11-17 6 r th ? t w pulse width t w (s) transient thermal impedance r th ( /w) drain-source voltage v ds (v) safe operating area drain current i d (a) 1 0.001 10 100 1000 0.01 0.1 1 10 100 1000 device mounted on a glass-epoxy board (a) (note 2a) (1) single-device operation (note 3a) (2) single-device value at dual operation (note 3b) device mounted on a glass-epoxy board (b) (note 2b) (3) single-device operation (note 3a) (4) single-device value at dual operation (note 3b) (4) (3) (2) (1) single pulse -10 -0.1 -100 -10 -1 -100 * single pulse ta = 25c curves must be derated linearly with increase in temperature. i d max (pulsed) * 10 ms * 1 ms * v dss ma x -1 -0.1
TPCF8304 2006-11-17 7 restrictions on product use 20070701-en ? the information contained herein is subject to change without notice. ? toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity a nd vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba produc ts, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshib a products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconduct or devices,? or ?toshiba semiconductor reliability handbook? etc. ? the toshiba products listed in this document are in tended for usage in general electronics applications (computer, personal equipment, office equipment, measuri ng equipment, industrial robotics, domestic appliances, etc.).these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfuncti on or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage incl ude atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, et c.. unintended usage of toshiba products listed in his document shall be made at the customer?s own risk. ? the products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba for any infringement s of patents or other rights of the third parties which may result from its use. no license is granted by implic ation or otherwise under any patents or other rights of toshiba or the third parties. ? please contact your sales representative for product- by-product details in this document regarding rohs compatibility. please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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